Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam

Ryo Shinozaki1, Osami Sasaki, Takamasa Suzuki

  • 1Core System Company, Ltd., 2-2 Nakajima 2, Nagaoka-shi 940-0094, Japan.

Applied Optics
|August 5, 2004
PubMed
Summary

A novel fast scanning method accurately measures surface profiles using laser beam deflection. This technique offers a low-cost, vibration-insensitive solution for precise surface characterization.

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