Fast scanning method for one-dimensional surface profile measurement by detecting angular deflection of a laser beam
Ryo Shinozaki1, Osami Sasaki, Takamasa Suzuki
1Core System Company, Ltd., 2-2 Nakajima 2, Nagaoka-shi 940-0094, Japan.
Applied Optics
|August 5, 2004
Summary
A novel fast scanning method accurately measures surface profiles using laser beam deflection. This technique offers a low-cost, vibration-insensitive solution for precise surface characterization.
Area of Science:
- Optics and Photonics
- Metrology
- Surface Science
Background:
- Accurate surface profile measurement is crucial for quality control in manufacturing and research.
- Existing methods can be slow, costly, or sensitive to environmental factors like vibration.
Purpose of the Study:
- To introduce a novel, high-speed, and cost-effective method for one-dimensional surface profile measurement.
- To demonstrate the method's accuracy and robustness compared to established techniques.
Main Methods:
- A scanning optical system employing a spherical concave mirror and a rotating scanner mirror was developed.
- Surface slope distribution was obtained via angular deflection of a scanning laser beam.
- The surface profile was reconstructed by integrating the measured slope distribution.
Main Results:
- The developed scanning method achieved high-speed measurements within milliseconds.
- A polygonal mirror's surface profile over a 5-mm width was successfully measured.
- The root-mean-square difference between the proposed method and interferometry was 0.98 nm.
Conclusions:
- The proposed fast scanning method provides accurate and reliable one-dimensional surface profile measurements.
- The system's low cost and insensitivity to mechanical vibration make it suitable for practical applications.
- This technique offers a viable alternative for high-speed surface metrology.
Related Concept Videos
Confocal Fluorescence Microscopy
Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Beams with Unsymmetric Loadings
Analyzing a supported beam under unsymmetrical loadings is essential in structural engineering to understand how beams respond to varied force distributions. This analysis involves calculating the deflection and identifying points where the slope of the beam is zero, which are crucial for ensuring structural stability and functionality.
The first moment-area theorem determines the slope at any point on the beam. This theorem indicates that the change in slope between two points on a beam...
The first moment-area theorem determines the slope at any point on the beam. This theorem indicates that the change in slope between two points on a beam...


