1HREM Research Inc., Higashimatsuyama, Saitama 355-0055, Japan. ishizuka@hremresearch.com
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The Fast Fourier Transform (FFT) multislice method, developed in 1977, is reviewed for its physical implications in electron microscopy simulations. This analysis addresses controversies and presents new findings for coherent convergent beam electron diffraction (CBED) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM).
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