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Updated: Jul 31, 2026

Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
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Characterization of crystallographic properties of SMC poly Si using electron backscattered diffraction

D I Kim1, K H Oh, H C Lee

  • 1School of Materials Science & Engineering, Seoul National University ENG445, San 56-1, Shilim-dong, Kwanak-ku, Seoul 151-744, Korea. dkim@imm.rwth-aachen.de

Journal of Microscopy
|August 19, 2004
PubMed

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