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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Cluster core-level binding-energy shifts: the role of lattice strain

B Richter1, H Kuhlenbeck, H J Freund

  • 1Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195, Berlin, Germany.

Physical Review Letters
|August 25, 2004
PubMed

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