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Updated: Jul 31, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Broadening of a nonequilibrium phase transition by extended structural defects

Thomas Vojta1

  • 1Department of Physics, University of Missouri-Rolla, Rolla, Missouri 65409, USA.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|September 28, 2004
PubMed

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