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Schlieren systems with coherent illumination for quantitative measurements
Boris Zakharin1, Josef Stricker
1Faculty of Aerospace Engineering, Technion-Israel Institute of Technology, Haifa 32000, Israel.
Applied Optics
|September 29, 2004
Summary
Coherent schlieren imaging was analyzed using Fourier optics. A modified Lopez cutoff filter improved phase object measurement accuracy compared to other filters, validating geometrical-optics approximations.
Area of Science:
- Optics
- Image Processing
Background:
- Schlieren systems are used for visualizing phase objects.
- Coherent light sources offer potential for enhanced imaging but require careful analysis.
Purpose of the Study:
- Investigate coherent schlieren imaging properties with various cutoff filters.
- Evaluate the performance of different filters for phase object measurement.
- Introduce and validate a new schlieren point-spread function.
Main Methods:
- Fourier optics technique applied to coherent schlieren systems.
- Analysis of systems with piecewise linear and Gaussian step function convolution filters.
- Development and simulation of a modified Lopez cutoff filter.
Main Results:
- Image formation approximated by geometrical-optics theory for graded filters.
- Nonlinear phase contribution estimation enables strong phase object measurement.
- Proposed modified Lopez filter outperforms other tested filters.
Conclusions:
- Coherent schlieren imaging can be effectively analyzed using Fourier optics.
- The modified Lopez cutoff filter offers superior performance for phase derivative measurements.
- The schlieren point-spread function provides a framework for linear approximation analysis.