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Scanning-probe Single-electron Capacitance Spectroscopy
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Scanning-probe Single-electron Capacitance Spectroscopy

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Surface charge compensation for a highly charged ion emission microscope

J W McDonald1, A V Hamza, M W Newman

  • 1Lawrence Livermore National Laboratory, L 472, Livermore, California 94550, USA. mcdonald6@llnl.gov

Ultramicroscopy
|September 29, 2004
PubMed

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