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Related Experiment Video

Updated: Jul 14, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Semiconductor industry: chipping in

Geoff Brumfiel

    Nature
    |October 8, 2004
    PubMed
    Summary

    No abstract available in PubMed .

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