Related Experiment Video

Updated: Aug 21, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

[Last but not least--the German Network EbM has got its glossary on EbM terms]

Regina Kunz1, Norbert Donner-Banzhoff, Monika Lelgemann

  • 1Gemeinsamer Bundesausschuss, Siegburg. regina.kunz@g-ba.de

Zeitschrift Fur Arztliche Fortbildung Und Qualitatssicherung
|October 19, 2004
PubMed

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