Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

A convenient and rapid sample repositioning approach for atomic force microscopy.

M Su1, Z Pan, V P Dravid

  • 1Department of Materials Science and Engineering, Institute for Nanotechnology, Northwestern University, Evanston, IL 60208, USA.

Journal of Microscopy
|November 2, 2004
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

A prototype differential atom interferometer for fundamental physics.

Nature·2026
Same author

Diverse Properties of Electron Forbush Decreases Revealed by the Dark Matter Particle Explorer.

Physical review letters·2026
Same author

Genome-wide association study on carcass traits in an indigenous yellow-feathered meat-type chicken population.

Animal : an international journal of animal bioscience·2026
Same author

Atypical presentation of angiosarcoma detected by <sup>18</sup>F-FDG PET/CT as a solitary mediastinal lesion.

Revista espanola de medicina nuclear e imagen molecular·2026
Same author

Additive effect of type 2 diabetes mellitus, sarcopenia, and hypertension on cardiovascular disease and mortality: A national-wide cohort study from China.

Journal of postgraduate medicine·2025
Same author

Deep learning model trained using multi-energy computed tomography (CT) data shows better metal artifact reduction for lumbar CT imaging.

Clinical radiology·2025

A new atomic force microscope method uses a male-female base system for precise specimen repositioning. This technique ensures reliable nanoscale imaging after multiple disturbances, enhancing experimental reproducibility.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Accurate repositioning of specimens is crucial for serial nanoscale imaging in atomic force microscopy (AFM).
  • Existing methods often struggle with maintaining precision after sample manipulation or environmental exposure.

Purpose of the Study:

  • To develop and validate a novel, robust repositioning strategy for atomic force microscopy specimens.
  • To enable reliable, repeated nanoscale imaging of samples under various experimental conditions.

Main Methods:

  • A keystone architecture-inspired approach was employed, creating a "male" base for the specimen and a "female" counterpart frame.
  • The system was tested using an acrylic acid frame and a metal base combination.
  • Repositioning accuracy was quantified by measuring translation shifts and angular disorientation.

Related Experiment Videos

Main Results:

  • The novel repositioning approach achieved 90% translation shifts under 10 micrometers.
  • Angular disorientation was consistently within +/- 3 degrees.
  • Nanoscale features were reliably relocated after up to 40 imaging-removal-imaging cycles, solution immersion, and heating to 500°C.

Conclusions:

  • The described male-female base system offers a highly accurate and reliable method for specimen repositioning in AFM.
  • This technique significantly improves the reproducibility of nanoscale imaging, even after demanding experimental procedures.