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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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Measurements of Kondo and spin splitting in single-electron transistors

A Kogan1, S Amasha, D Goldhaber-Gordon

  • 1Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.

Physical Review Letters
|November 5, 2004
PubMed

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