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Apertureless near-field scanning optical microscope working with or without laser source.

F Formanek1, Y De Wilde, L Aigouy

  • 1Laboratoire d'Optique Physique, Ecole Supérieure de Physique et de Chimie Industrielles, Université Pierre et Marie Curie, Paris, France. formanek@optique.espci.fr

Scanning
|November 16, 2004
PubMed
Summary

This study presents a versatile apertureless near-field scanning optical microscope (ANSOM) achieving <50 nm resolution across visible and infrared spectra. The setup demonstrates enhanced resolution through higher harmonic demodulation and can function as a near-field thermal optical microscope (NTOM).

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Area of Science:

  • Optical Microscopy
  • Nanotechnology
  • Materials Science

Background:

  • Apertureless near-field scanning optical microscopy (ANSOM) offers high-resolution imaging capabilities.
  • Versatile setups are crucial for broad spectral range and varied configurations.

Purpose of the Study:

  • To present a versatile, home-made ANSOM setup.
  • To demonstrate its broad spectral imaging capabilities and resolution.
  • To explore enhanced resolution techniques and thermal imaging applications.

Main Methods:

  • Utilized a tungsten tip on a quartz tuning fork in tapping mode.
  • Performed imaging in visible (655 nm) and infrared (10.6 µm) spectra.
  • Investigated higher harmonic demodulation and thermal emission imaging.

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Main Results:

  • Achieved optical resolution consistently below 50 nm across different wavelengths.
  • Demonstrated improved resolution via higher harmonic signal demodulation.
  • Successfully imaged infrared near-field thermal emission without external illumination.

Conclusions:

  • The developed ANSOM is a versatile tool for high-resolution optical and thermal near-field imaging.
  • Probe sharpening through harmonic demodulation effectively enhances resolution.
  • The system's adaptability extends its application to near-field thermal optical microscopy (NTOM).