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Microscopic models for dielectric relaxation in disordered systems
Yuri P Kalmykov1, William T Coffey, Derrick S F Crothers
1Groupe de Physique Moléculaire, MEPS, Université de Perpignan, 52, Avenue Paul Alduy, 66860, Perpignan Cedex, France.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|December 17, 2004
Summary
This study extends the Debye rotational diffusion model to explain anomalous dielectric relaxation using fractional kinetics. The research derives the Havriliak-Negami equation from a generalized kinetic model for polar molecules.
Area of Science:
- Physics
- Physical Chemistry
- Materials Science
Background:
- Dielectric relaxation in polar molecules is often described by the Debye model.
- Anomalous dielectric relaxation phenomena necessitate more complex models like the Havriliak-Negami equation.
- Microscopic underpinnings of these relaxation mechanisms require further elucidation.
Purpose of the Study:
- To develop a microscopic model for anomalous dielectric relaxation.
- To extend the Debye rotational diffusion model to incorporate fractional kinetics.
- To derive the empirical Havriliak-Negami equation from first principles.
Main Methods:
- Generalizing the Fokker-Planck (Smoluchowski) equation to fractional kinetics.
- Employing a discrete time random walk on a unit sphere for microscopic description.
- Utilizing Fourier transform techniques to solve the kinetic equation.
Main Results:
- Successfully derived the Havriliak-Negami equation from a generalized kinetic model.
- Obtained the Green function and complex dielectric susceptibility for HN anomalous relaxation.
- Established a microscopic basis for anomalous dielectric relaxation phenomena.
Conclusions:
- The generalized kinetic model provides a microscopic foundation for the Havriliak-Negami dielectric relaxation mechanism.
- Fractional kinetics offers a powerful framework for understanding anomalous relaxation in polar materials.
- This approach bridges macroscopic empirical laws with microscopic physical processes.