A general model for the analysis of mark-resight, mark-recapture, and band-recovery data under tag loss

Paul B Conn1, William L Kendall, Michael D Samuel

  • 1Department of Statistics, North Carolina State University, Campus Box 8203, Raleigh, North Carolina 27695, USA. pconn@cnr.colostate.edu

Biometrics
|December 21, 2004
PubMed