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Related Experiment Videos

Gonioreflectometer for measuring spectral diffuse reflectance.

Saulius Nevas1, Farshid Manoocheri, Erkki Ikonen

  • 1Metrology Research Institute, Helsinki University of Technology, PO Box 3000, FIN-02015 HUT, Finland. saulius.nevas@hut.fi

Applied Optics
|December 25, 2004
PubMed
Summary

Gonioreflectometry offers an alternative to integrating spheres for measuring reflectance. This method accurately determines diffuse reflectance factors, achieving high precision for white artifacts.

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Area of Science:

  • Optical metrology
  • Spectrophotometry
  • Material characterization

Background:

  • Integrating sphere methods are standard for measuring hemispherical reflectance.
  • Gonioreflectometry provides directional-angular information about reflected light.
  • Developing alternative methods for accurate reflectance determination is crucial.

Purpose of the Study:

  • To present gonioreflectometry as an alternative to integrating sphere methods.
  • To detail a gonioreflectometer for absolute reflectance factor measurements.
  • To establish an absolute scale for diffuse reflectance factors.

Main Methods:

  • Hemispherical collection of reflected flux.
  • Utilizing a gonioreflectometer for spectral measurements (360-830 nm).

Related Experiment Videos

  • Integrating gonioreflectometric data to obtain hemispherical reflectance factors.

    • Main Results:

    • Demonstrated an alternative to integrating sphere techniques.
    • Established an absolute scale for total diffuse reflectance factors.
    • Achieved a combined standard uncertainty of 0.20% for white artifacts.

    Conclusions:

    • Gonioreflectometry is a viable method for absolute reflectance factor determination.
    • The developed instrument provides accurate and traceable measurements.
    • Results align with established integrating-sphere-based scales.