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Related Experiment Videos

Testing fast aspheric convex surfaces with a linear array of sources.

Manuel Campos-García1, Rufino Díaz-Uribe, Fermín Granados-Agustín

  • 1Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autonoma de México, Apdo. Postal 70-186, México 04510, D. F. México. camposm@aleph.cinstrum.unam.mx

Applied Optics
|December 29, 2004
PubMed
Summary

This study presents a noncontact method for accurately measuring the shapes of fast convex surfaces using a linear array of light sources. The technique ensures precise surface evaluation, crucial for quality control in advanced material manufacturing.

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Area of Science:

  • Optical Metrology
  • Surface Characterization
  • Precision Engineering

Background:

  • Accurate measurement of convex surfaces is essential in various fields, including optics and manufacturing.
  • Existing noncontact methods often face limitations in speed, accuracy, or applicability to fast-moving surfaces.

Purpose of the Study:

  • To develop and validate a novel noncontact test procedure for determining the shapes of fast convex surfaces.
  • To establish the required measurement accuracies for achieving high-precision surface characterization.

Main Methods:

  • Utilized a linear array of light sources to generate equally spaced bright spots via reflection on the convex surface.
  • Employed surface rotation to capture data from all meridians for a complete 360-degree measurement.

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  • Implemented a numerical integration method using parabolic arcs for enhanced accuracy in surface shape evaluation.

    • Main Results:

    • The developed algorithm accurately reconstructs surface shapes.
    • Achieving sub-5-micrometer accuracy necessitates centroid coordinate measurements within 0.5 pixels and source position measurements within 0.5 mm.
    • Experimental validation on a carbon fiber sphere demonstrated the method's efficacy.

    Conclusions:

    • The proposed noncontact method offers a viable solution for rapid and accurate convex surface shape measurement.
    • The study defines critical accuracy requirements for optical components and measurement systems.
    • This technique is suitable for quality control of precision components, especially those made from advanced materials.