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Very high resolution chemical imaging with Infrared Scanning Near-field Optical Microscopy (IR-SNOM)

Dusan Vobornik1, Giorgio Margaritondo, Slavenka Vobornik

  • 1Institut de Physique de la Matiére Complexe, Ecole Polytechnique Fédérale, CH-1015 Lausanne, Switzerland.

Summary

This study showcases Scanning Near-field Optical Microscopy (SNOM) combined with an Infrared Free Electron Laser (IR FEL) for high-resolution chemical imaging. The technique reveals phase distribution in boron-nitride films and cellular structures, highlighting its broad applications.

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