Separating reflection components based on chromaticity and noise analysis
Related Experiment Video
Updated: Aug 20, 2026

Applying Hyperspectral Reflectance Imaging to Investigate the Palettes and the Techniques of Painters
Published on: June 18, 2021
Robby T Tan1, Ko Nishino, Katsushi Ikeuchi
1Department of Computer Science, The University of Tokyo, 3rd Dept Ikeuchi Laboratory, 4-6-1 Komba, Meguro-ku, Tokyo 153-8505, Japan. robby@cvl.iis.u-tokyo.ac.jp
Abstract:
Many algorithms in computer vision assume diffuse only reflections and deem specular reflections to be outliers. However, in the real world, the presence of specular reflections is inevitable since there are many dielectric inhomogeneous objects which have both diffuse and specular reflections. To resolve this problem, we present a method to separate the two reflection components. The method is principally based on the distribution of specular and diffuse points in a two-dimensional maximum chromaticity-intensity space. We found that, by utilizing the space and known illumination color, the problem of reflection component separation can be simplified into the problem of identifying diffuse maximum chromaticity. To be able to identify the diffuse maximum chromaticity correctly, an analysis of the noise is required since most real images suffer from it. Unlike existing methods, the proposed method can separate the reflection components robustly for any kind of surface roughness and light direction.
Related Concept Videos
Chromatographic Resolution
The effectiveness of separation can be evaluated by determining the level of separation between two neighboring peaks in a chromatogram, which represents the individual components of a sample.
In chromatography,...
Optimizing Chromatographic Separations
Band broadening refers to spreading solute bands as they travel through the column. This broadening can impact resolution. Plate height (H) represents the length required for one theoretical plate. A lower plate height corresponds to...
IR Spectrometers
Chromatographic Methods: Terminology

