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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Off-axis electron holography of unbiased and reverse-biased focused ion beam milled Si p-n junctions

Alison C Twitchett1, Rafal E Dunin-Borkowski, Robert J Hallifax

  • 1Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 3, 2005
PubMed

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