Related Experiment Video

Updated: Aug 19, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Independent component analysis: a new possibility for analysing series of electron energy loss spectra

Noël Bonnet1, Danielle Nuzillard

  • 1INSERM, UMRS 514 (IFR53), Hôpital Maison Blanche, 45, rue Cognacq Jay, 51092 Reims Cedex, France. noel.bonnet@univ-reims.fr

Ultramicroscopy
|February 8, 2005
PubMed

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