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Updated: Aug 19, 2026

Real-Time Proxy-Control of Re-Parameterized Peripheral Signals using a Close-Loop Interface
Published on: May 8, 2021
X-modulation: instrumentation and optimization
1Maurice Morton Institute of Polymer Science, The University of Akron, Akron, Ohio 44325-3909, USA.
Abstract:
The measurement of lateral force in response to small amplitude lateral oscillations of a sample using a scanning probe microscope (X-modulation) is presented as an effective means of identifying key qualitative differences in the nanomechanical behavior of solid surfaces. To study the surface behavior in detail, it is critical that the instrument have sufficient flexibility. Computer-assisted measurement automation achieved using LabVIEW makes an X-modulation experiment more flexible and convenient. Even though further refinement of the modulation technique is necessary in both theory and experiment to obtain a complete picture, the systematic approach made possible by this sort of instrumentation is valuable for the study of mechanical properties of the surface.
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