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Polychromatic X-ray microdiffraction studies of mesoscale structure and dynamics.

G E Ice1, B C Larson, W Yang

  • 1Oak Ridge National Laboratory, Oak Ridge, TN 37831-6118, USA. icege@ornl.gov

Journal of Synchrotron Radiation
|February 25, 2005
PubMed
Summary

Polychromatic X-ray microdiffraction offers a powerful, non-destructive method to map 3D mesoscale structure and strain in materials. This technique provides high-resolution insights into crystalline morphology, grain boundaries, and defects.

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Area of Science:

  • Materials Science
  • Crystallography
  • Physics

Background:

  • Mesoscale structure and dynamics are critical for material properties.
  • Characterizing these features non-destructively is challenging.
  • Advanced X-ray techniques are needed for detailed analysis.

Purpose of the Study:

  • To describe the theory, instrumentation, and applications of polychromatic X-ray microdiffraction.
  • To highlight its capabilities in mapping 3D mesoscale structure and strain.
  • To demonstrate its utility in characterizing material microstructures.

Main Methods:

  • Utilizing polychromatic X-ray microdiffraction for 3D mapping.
  • Employing differential-aperture depth profiling for subsurface analysis.
  • Combining with monochromatic measurements for complete strain tensor determination.

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Main Results:

  • High spatial and angular resolution achieved for mapping crystalline phase, orientation, and strain.
  • Elastic strain tensor elements measurable to approximately 10(-4) or better.
  • 3D mapping of crystalline morphology, including grain boundaries and second phases, with sub-micrometric resolution.

Conclusions:

  • Polychromatic X-ray microdiffraction is a versatile tool for mesoscale analysis.
  • It enables detailed, non-destructive characterization of material structure and strain.
  • The technique is valuable for understanding material behavior and properties.