Parameter measurement of the cylindrically curved thin layer using low-frequency circumferential Lamb waves

Xiao Chen1, Mingxi Wan

  • 1Department of Biomedical Engineering, School of Life Science and Technology, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China.

Ultrasonics
|March 2, 2005
PubMed
Summary

This study introduces a low-frequency circumferential Lamb wave method to measure elastic constants, thickness, and radius of curved thin layers. The technique accurately characterizes thin layers with minimal error, even for thicknesses down to 10% of the wavelength.

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