Related Experiment Video

Updated: Aug 19, 2026

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

Sculpting nanoelectrodes with a transmission electron beam for electrical and geometrical characterization of

Henny W Zandbergen1, Robert J H A van Duuren, Paul F A Alkemade

  • 1Kavli Institute of NanoScience, Delft University of Technology, 2628 CJ Delft, The Netherlands. H.W.Zandbergen@tnw.tudelft.nl

Nano Letters
|March 10, 2005
PubMed

More Related Videos

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens07:15

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

Published on: June 2, 2017

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...