Atomic XAFS as a tool to probe the electronic properties of supported noble metal nanoclusters
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Updated: Jul 28, 2026

Characterization of Electrode Materials for Lithium Ion and Sodium Ion Batteries Using Synchrotron Radiation Techniques
Published on: November 11, 2013
Ad M J van der Eerden1, Tom Visser, T Alexander Nijhuis
1Department of Inorganic Chemistry and Catalysis, Debye Institute, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, The Netherlands.
Abstract:
Atomic XAFS is a very attractive technique for probing electronic properties of supported metal nanoclusters. For platinum nanoparticles on different supports, the technique is found to be in good agreement with infrared CO adsorption measurements. The advantages of AXAFS, however, are that no probe molecule is required and that real-time measurements under reaction conditions are possible.
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