Prospects for aberration-free electron microscopy

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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H Rose1

  • 1Institute of Applied Physics, Darmstadt University of Technology, Hochschulstrasse 6, Darmstadt D-64289, Germany. rose@ltoi.iap.physik.tu-darmstadt.de

Ultramicroscopy
|March 22, 2005
PubMed

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