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Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in

Rafal E Dunin-Borkowski1, Simon B Newcomb, Takeshi Kasama

  • 1Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK. rafal.db@msm.cam.ac.uk

Ultramicroscopy
|March 22, 2005
PubMed

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