[A new approach to correction method for matrix effect in X-ray fluorescence spectroscopy analysis]

Area of Science:

• Analytical Chemistry
• Materials Science

Context:

• Accurate elemental analysis of complex samples is crucial in materials science and industrial quality control.
• Traditional methods often struggle with matrix effects in multicomponent systems.
• X-ray fluorescence (XRF) spectroscopy is a widely used technique for elemental analysis.

Purpose:

• To develop and validate a new theoretical mathematical model for correcting multicomponent matrix effects in X-ray fluorescence (XRF) analysis.
• To provide a novel method for calculating influence coefficients (alpha and beta) with clear physical meaning.
• To assess the significance of tertiary fluorescence effects in complex sample analysis.

Summary:

• A fundamental parameter program was used to calculate X-ray fluorescence intensities and matrix effects for multicomponent samples.
• A new theoretical model for correcting multicomponent matrix effects was deduced, offering a new method to calculate influence coefficients.
• The model demonstrated satisfactory results in analyzing stainless steel, highlighting the importance of considering tertiary fluorescence, especially for Cr analysis in Ni-rich steel.

Impact:

• Provides a more accurate method for elemental composition determination in complex matrices.
• Enhances the reliability of XRF analysis for industrial applications, such as quality control of alloys.
• Highlights the need to account for tertiary fluorescence effects for improved analytical precision in specific scenarios.