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Related Experiment Videos

Bend loss effects in diffused, buried waveguides.

James T A Carriere1, Jesse A Frantz, Brian R West

  • 1Optical Sciences Center, University of Arizona, 1630 East University Boulevard, Tucson, Arizona 85721-0094, USA. carriere@u.arizona.edu

Applied Optics
|April 9, 2005
PubMed
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Bend loss in buried ion-exchanged waveguides is influenced by fabrication factors like bend radius and process duration. Understanding these effects is crucial for optimizing waveguide device design and performance.

Area of Science:

  • Optical Engineering
  • Materials Science

Background:

  • Diffused, buried waveguides lack analytical mode solutions, necessitating mode expansion for analysis.
  • Bend loss is a critical parameter affecting the performance of optical waveguide devices.

Purpose of the Study:

  • To investigate the impact of various fabrication parameters on bend loss in buried ion-exchanged waveguides.
  • To provide insights into optimizing waveguide design for reduced bend loss.

Main Methods:

  • Mode expansion of bend modes using straight waveguide modes.
  • Analysis of bend loss under typical fabrication conditions for buried ion-exchanged waveguides.

Main Results:

  • Bend loss is significantly affected by bend radius.

Related Experiment Videos

  • The duration of ion exchange and burial processes influences bend loss.
  • Mask opening size and applied field during burial impact bend loss.

    • Conclusions:

    • Fabrication parameters critically influence bend loss in buried ion-exchanged waveguides.
    • Optimization of bend radius, process duration, and burial conditions can mitigate bend loss.