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[FPMULTI--a software for multi-layer composition and thickness analysis and its applications].

G Tao1, A Ji, S Zhuo

  • 1Shanghai Institute of Ceramics, Chinese Academy of Sciences, 200050 Shanghai.

Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu
|April 12, 2005
PubMed
Summary

FPMULTI software analyzes multi-layer sample composition and thickness using X-ray fluorescence (XRF). This fundamental parameter approach offers superior accuracy over linear regression, especially with limited calibration standards.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Context:

  • Accurate characterization of multi-layer materials is crucial for industrial applications.
  • Existing methods for analyzing complex sample compositions can be limited in scope or accuracy.
  • X-ray fluorescence (XRF) is a powerful, non-destructive technique for elemental analysis.

Purpose:

  • To introduce FPMULTI, a novel software tool for simultaneous analysis of multi-layer sample composition and thickness.
  • To demonstrate the capabilities of the fundamental parameter method in XRF analysis for complex samples.
  • To compare the performance of FPMULTI against traditional linear regression methods.

Summary:

  • FPMULTI software utilizes the fundamental parameter method for XRF analysis of multi-layer samples.

Related Experiment Videos

  • It can determine up to 10 layers and 25 elements, using bulk or multi-layer calibration standards.
  • The software predicts X-ray line intensities versus thickness, enabling accurate sample analysis, outperforming linear regression with fewer standards.

    • Impact:

    • Provides a more accurate and efficient method for analyzing multi-layer materials like tin-plates and galvanized zinc-plates.
    • Highlights the advantages of the fundamental parameter approach in XRF, particularly when calibration standards are scarce.
    • Enables improved quality control and material development in industries reliant on thin-film coatings.