[Determination of Si, P, Nb and Ti in steels by ICP-AES with offset profile additional lines]

This article introduced the increment of measurement channels for the elements silicon, phosphorus, niobium and titanium by changing the entrance slit angle, based on the fixed channels of the ICP-AES. The entrance slit angle was controlled by a motor. We determined trace silicon, phosphorus, niobium and titanium in steels, and examined the detection limits, accuracy and precision, and the results were satisfactory. With this method, we could also determine other elements, and widened the applied range of ICP-AES.