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Updated: Aug 18, 2026

High Pressure Single Crystal Diffraction at PX^2
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High Pressure Single Crystal Diffraction at PX^2

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Absolute measurement of lattice parameter in single crystals and epitaxic layers on a double-crystal X-ray

M Fatemi1

  • 1Electronics Science and Technology Division, Naval Research Laboratory, Washington, DC 20375, USA. fatemi@estd.nrl.navy.mil

Acta Crystallographica. Section A, Foundations of Crystallography
|April 23, 2005
PubMed

Keywords:
X-ray diffractionlattice parameter measurementsingle crystal analysisthin film characterization

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