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Analysis of three-dimensional software EIT (electrical impedance tomography) phantoms by the finite element method

M Kuzuoglu1, M Moh'dSaid, Y Z Ider

  • 1Department of Electrical and Electronics Engineering, METU, Ankara, Turkey.

Summary

Three-dimensional (3D) conductivity variations significantly impact electrical impedance tomography (EIT) imaging. This study uses 3D finite element analysis to show how these variations affect measured voltages, even when the 2D measurement plane appears identical.

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