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Updated: May 2, 2026

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Published on: October 2, 2017
Measurement of femtometre-scale atomic displacements by X-ray absorption spectroscopy
Robert F Pettifer1, Olivier Mathon, Sakura Pascarelli
1Department of Physics, University of Warwick, Coventry CV4 7AL, UK. r.pettifer@warwick.ac.uk
Abstract:
The frequencies of extended X-ray absorption fine-structure (EXAFS) measurements, which are oscillations occurring on the high-energy side of an X-ray absorption edge, can be used to identify interatomic distances in materials. We have used a dispersive X-ray spectrometer, which has no moving components, to make rapid measurements with minimal energy drift of the difference in EXAFS from the Fe K edge in an iron-cobalt thin film undergoing periodic strain through magnetostriction. We show that magnetostriction can be detected by differential X-ray absorption. The magnitude of the recorded signal relative to the noise shows a sensitivity to mean differential atomic motion of one femtometre: a factor of 100 times more sensitive than that normally available.
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