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Comment on "Structural analysis of the SiO2/Si(100) interface by means of photoelectron diffraction"

Angelo Bongiorno1, Alfredo Pasquarello

  • 1School of Physics, Georgia Institute of Technology, 837 State Street, Atlanta, GA 30332-0430, USA.

Physical Review Letters
|May 21, 2005
PubMed
Abstract

No abstract available in PubMed .

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