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Simultaneous measurement of various optical parameters in a multilayer optical waveguide by a Michelson precision
Yi-Ping Wang1, Jian-Ping Chen, Xin-Wan Li
1State Key Laboratory on Fiber-Optic Local Area Network and Advanced Optical Communication Systems, Shanghai Jiao Tong University, Shanghai 200030, China.
Optics Letters
|May 24, 2005
Abstract:
A novel reflectometer based on Michelson interference is proposed and used to measure various optical parameters of homogeneous multilayer optical waveguides. Refractive indices, thickness, insertion loss, absorbed loss, Fresnel reflectance, and diffuse reflection coefficients of optical waveguides can be measured simultaneously.
