K S Sim1, N S Kamel, H T Chuah
1Faculty of Engineering and Technology, Multimedia University, Jalan Ayer Keroh Lama, Bukit Beruang, 75450 Melaka, Malaysia. kssim@mmu.edu.my
This study introduces the AR-Wiener filter for enhancing scanning electron microscope (SEM) images. The novel filter improves noise estimation for clearer real-time SEM image processing.
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