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Updated: Aug 17, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Electron channeling X-ray microanalysis for partially filled skutterudite structure

Takao Morimura1, Masayuki Hasaka

  • 1Graduate School of Science and Technology, Nagasaki University, 1-14 Bunkyo-machi, Nagasaki 852-8521, Japan. tmori@net.nagasaki-u.ac.jp

Micron (Oxford, England : 1993)
|June 7, 2005
PubMed

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