UV-vis-infrared optical and AFM study of spin-cast chitosan films

Optical properties of spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region of the spectrum using spectroscopic ellipsometry. Optical constants for the UV-vis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms combined with Lorentzian oscillator models in the absorptive shorter wavelength regions. Infrared index of refraction and extinction coefficients from 750 to 4000 cm(-1) were determined using ellipsometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical anisotropy was present and measurable over all wavelength regions of ellipsometric data. To obtain information on the micro- and nano-scale surface structure, tapping mode atomic force microscopy (AFM) imaging was employed to determine morphology and roughness information of dry spin-cast chitosan films.