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Updated: Aug 17, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
A separation of the refractive index and topography in photon-scanning tunneling microscopy: simulations and
Xiaoqiu Wang1, Jian Zhang, Yinli Li
1Department of Physics, Dalian University of Technology, Dalian 116024, China. wangxqdl@sina.com
Abstract:
In order to separate the purely optical and topographic information from images in constant-gap mode simultaneously, we proposed the atomic force/photon-scanning tunneling microscopy (AF/PSTM). In this paper, we focus on the principle of separation of the refractive index image from the images of photon-scanning tunneling microscopy. We prove the formula of refractive index imaging by using a three-dimensional finite-difference time-domain method. The formula indicates that the refractive index of a sample is approximately proportional to photon tunneling information (DeltaI/I )2. From the viewpoint of practical use, we simulated the refractive index images for the realistic experiments. We present line scans along two orthogonal directions and the transmitted intensity as a function of the tip position under the constant-gap mode. The experimental results are presented and are in good agreement with the numerical results.
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