Spontaneous decay rates in active waveguides
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Updated: Aug 17, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Andrés Anibal Rieznik1, Gustavo Rigolin
1Optics and Photonics Research Center, Instituto de Física Gleb Wataghin, Universidade Estadual de Campinas, cep 13083-970, Campinas, São Paulo, Brazil. anibal@ifi.unicamp.br
Abstract:
We present a new method of measuring the guided, radiated, and total decay rates in uniform waveguides. It is also shown theoretically that large modifications of the total decay rate can be achieved in realistic erbium-doped fiber amplifiers and erbium-doped waveguide amplifiers with effective mode area radii smaller than approximately 1 microm.
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