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Updated: Aug 17, 2026

High Spatial Resolution Chemical Imaging of Implant-Associated Infections with X-ray Excited Luminescence Chemical Imaging Through Tissue
Published on: September 30, 2022
Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors
S Huotari1, Gy Vankó, F Albergamo
1European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble CEDEX 9, France. huotari@esrf.fr
Abstract:
A dispersion-compensation method to remove the cube-size effect from the resolution function of diced analyzer crystals using a position-sensitive two-dimensional pixel detector is presented. For demonstration, a resolution of 23 meV was achieved with a spectrometer based on a 1 m Rowland circle and a diced Si(555) analyzer crystal in a near-backscattering geometry, with a Bragg angle of 88.5 degrees . In this geometry the spectrometer equipped with a traditional position-insensitive detector provides a resolution of 190 meV. The dispersion-compensation method thus allows a substantial increase in the resolving power without any loss of signal intensity.
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