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Profiles with microscopic resolution by single-sided NMR.

J Perlo1, F Casanova, B Blümich

  • 1Institut für Technische und Makromolekulare Chemie, RWTH, Aachen D-52056, Germany.

Journal of Magnetic Resonance (San Diego, Calif. : 1997)
|June 25, 2005
PubMed
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This study introduces a novel single-sided NMR sensor for non-destructive depth profiling. The sensor achieves microscopic spatial resolution, enabling detailed characterization of sample structures.

Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Nuclear Magnetic Resonance (NMR) is a powerful spectroscopic technique.
  • Current NMR methods often require complex setups and sample preparation.
  • There is a need for non-destructive, high-resolution profiling techniques for various materials.

Purpose of the Study:

  • To present a novel single-sided NMR sensor.
  • To achieve microscopic spatial resolution in depth profiling.
  • To enable non-destructive characterization of arbitrarily sized objects.

Main Methods:

  • Development of a single-sided NMR sensor with a novel permanent magnet geometry.
  • Generation of a highly flat sensitive volume parallel to the scanner surface.

Related Experiment Videos

  • Repositioning of the sensitive slice to obtain one-dimensional profiles.

    • Main Results:

    • The sensor produces depth profiles with microscopic spatial resolution (<5 microm).
    • A highly flat sensitive volume ensures consistent measurements.
    • The open geometry allows for the testing of arbitrarily sized objects.

    Conclusions:

    • The developed NMR sensor is a powerful tool for non-destructive material characterization.
    • It offers high spatial resolution for detailed sample structure analysis.
    • The sensor's design facilitates versatile applications in various scientific fields.