Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a

S Van Aert1, A J den Dekker, A van den Bos

  • 1Department of Physics, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. sandra.vanaert@ua.ac.be

Ultramicroscopy
|June 29, 2005
PubMed