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Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
Published on: January 4, 2016
Near-infrared spectroscopy for monitoring wafer etchant solution using a teflon tube
Youngbok Lee1, Sanghee Nah, Hankyu Namkung
1Department of Chemistry, College of Natural Sciences, Hanyang University, Haengdang-Dong, Seongdong-Gu, Seoul, Korea 133-791.
Applied Spectroscopy
|August 2, 2005
Abstract
No abstract available in PubMed .

