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Quantitative high-pressure pair distribution function analysis.

John B Parise1, Sytle M Antao, F Marc Michel

  • 1Center for Environmental Molecular Sciences, CEMS, Stony Brook, NY 11794, USA. john.parise@stonybrook.edu

Journal of Synchrotron Radiation
|August 27, 2005
PubMed
Summary
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High-brightness synchrotron facilities enable straightforward high-pressure, high-temperature scattering data collection. Advanced techniques, like high-energy X-rays, yield quantitative data for nano-crystalline materials, aiding pair distribution function analysis.

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Crystallography

Background:

  • High-pressure and high-temperature scattering data collection is increasingly accessible.
  • Developments in synchrotron radiation sources have improved data quality and accessibility.

Purpose of the Study:

  • To highlight advancements in collecting scattering data under extreme conditions.
  • To demonstrate the utility of high-energy X-rays for analyzing nano-crystalline and glassy materials.

Main Methods:

  • Utilizing high-brightness synchrotron radiation facilities.
  • Employing large-volume high-pressure apparatus and diamond anvil cells.
  • Using focused high-energy X-rays (>80 keV) for total elastic scattering measurements.

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Main Results:

  • Reliable powder diffraction data suitable for structure determination and Rietveld refinement are routinely collected up to 30 GPa.
  • Quantitative scattering data for nano-crystalline materials, suitable for pair distribution function analysis, can be obtained using high-energy X-rays.

Conclusions:

  • Modern synchrotron facilities facilitate routine high-pressure, high-temperature scattering experiments.
  • Advanced X-ray techniques enable detailed structural analysis of challenging materials like nano-crystalline and glassy substances.