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Updated: Aug 16, 2026

Blast Quantification Using Hopkinson Pressure Bars
Published on: July 5, 2016
Quantitative high-pressure pair distribution function analysis
John B Parise1, Sytle M Antao, F Marc Michel
1Center for Environmental Molecular Sciences, CEMS, Stony Brook, NY 11794, USA. john.parise@stonybrook.edu
Abstract:
The collection of scattering data at high pressure and temperature is now relatively straightforward thanks to developments at high-brightness synchrotron radiation facilities. Reliable data from powders, that are suitable for structure determination and Rietveld refinement, are routinely collected up to about 30 GPa in either a large-volume high-pressure apparatus or diamond anvil cell. In those cases where the total elastic scattering is of interest, as it is in the case of nano-crystalline and glassy materials, technical developments, including the use of focused high-energy X-rays (>80 keV), are advantageous. Recently completed experiments on nano-crystalline materials at the 1-ID beamline at the Advanced Photon Source suggest that quantitative data, suitable for pair distribution function analysis, can be obtained.
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