Jun Yamasaki1, Tomoyuki Kawai, Nobuo Tanaka
1EcoTopia Science Institute and Department of Crystalline Materials Science, Nagoya University, Chikusa-ku, Nagoya, 464-8603, Japan.
A new method minimizes non-linear contrast in spherical aberration-corrected electron microscopy images. This technique enhances high-resolution imaging down to 0.1 nm but has limitations for thicker crystals.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: