In-fiber reflection mode interferometer based on a long-period grating for external refractive-index measurement

Dae Woong Kim1, Yan Zhang, Kristie L Cooper

  • 1Center for Photonics Technology, Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061-0111, USA. dakim1@vt.edu

Applied Optics
|September 16, 2005
PubMed