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Nondestructive method for the characterization of ion-implanted waveguides.

Andrea Guarino1, Peter Günter

  • 1Nonlinear Optics Laboratory, Institute of Quantum Electronics, Swiss Federal Institute of Technology, ETH Hönggerberg, CH-8093 Zürich, Switzerland. guarino@phys.ethz.ch

Optics Letters
|October 4, 2005
PubMed
Summary

A novel barrier coupling method efficiently couples light into ion-implanted waveguides. This technique accurately determines waveguide effective indices non-destructively, offering a simpler alternative to existing methods.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Waveguide Technology

Background:

  • Efficient light coupling into waveguides is crucial for photonic device performance.
  • Existing methods for characterizing ion-implanted waveguides can be complex or destructive.

Purpose of the Study:

  • To introduce and validate a new, simpler, and non-destructive method for light coupling into ion-implanted waveguides.
  • To determine the effective indices of guided modes in ion-implanted waveguides.

Main Methods:

  • Development of barrier coupling, analogous to prism coupling, utilizing frustrated total reflection.
  • Light coupling achieved by varying incident angle at a barrier region with a decreased refractive index.
  • Determination of effective indices via minima in non-incoupled reflected light.

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Main Results:

  • Successful demonstration of barrier coupling for light injection into ion-implanted waveguides.
  • Accurate measurement of effective indices for guided modes in a KNbO3 ion-implanted waveguide.
  • The method proved simpler, more accurate, and non-destructive compared to other techniques.

Conclusions:

  • Barrier coupling is an effective and advantageous technique for characterizing ion-implanted waveguides.
  • This method offers a significant improvement in simplicity, accuracy, and non-destructiveness for waveguide analysis.
  • The technique holds promise for advancing integrated optics and photonic device fabrication.