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Updated: Jul 28, 2026

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Published on: April 24, 2018
In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si
1Department of Physics, Washington University, St. Louis, Missouri 63130, USA.
Abstract:
Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.
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